Information card for entry 2004303
| Common name |
5-acetylmutilin |
| Chemical name |
[3aS-(3aα,4β,5α,6α,8β,9α,9αβ,10S*]-5-acetate-6-ethenyloctahydro-5,8- dihydroxy-4,6,9,10-tetramethyl-3a,9-propano-3aH-cyclopentacycloocten-1(4H)-one |
| Formula |
C22 H34 O4 |
| Calculated formula |
C22 H34 O4 |
| SMILES |
O=C1CC[C@@]23[C@H]([C@H](OC(=O)C)[C@](C[C@@H](O)[C@@]([C@H]12)([C@@H](CC3)C)C)(C)C=C)C |
| Title of publication |
Absolute Configuration of Mutilin, 5-Acetylmutilin and 5-Bromoacetylmutilin |
| Authors of publication |
Pilati, T.; Cravotto, G.; Palmisano, G. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1995 |
| Journal volume |
51 |
| Journal issue |
12 |
| Pages of publication |
2676 - 2680 |
| a |
7.063 ± 0.001 Å |
| b |
15.863 ± 0.002 Å |
| c |
18.027 ± 0.003 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2019.8 ± 0.5 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
19 |
| Hermann-Mauguin space group symbol |
P 21 21 21 |
| Hall space group symbol |
P 2ac 2ab |
| Residual factor for all reflections |
0.0696 |
| Residual factor for significantly intense reflections |
0.0448 |
| Weighted residual factors for all reflections |
0.0994 |
| Weighted residual factors for significantly intense reflections |
0.0887 |
| Goodness-of-fit parameter for all reflections |
1.067 |
| Goodness-of-fit parameter for significantly intense reflections |
1.109 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/2004303.html