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Information card for entry 2004484
Preview
| Coordinates | 2004484.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Aquachlorotriphenyltin.3,4,7,8-tetramethyl-1,10-phenanthroline |
|---|---|
| Formula | C34 H33 Cl N2 O Sn |
| Calculated formula | C34 H33 Cl N2 O Sn |
| SMILES | [Sn](Cl)([OH2])(c1ccccc1)(c1ccccc1)c1ccccc1.n1c2c(c(c(c1)C)C)ccc1c(c(cnc12)C)C |
| Title of publication | A 1:1 Adduct of Aquachlorotriphenyltin with 3,4,7,8-Tetramethyl-1,10-phenanthroline |
| Authors of publication | Ng, S. W. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 2 |
| Pages of publication | 354 - 356 |
| a | 16.373 ± 0.004 Å |
| b | 10.4066 ± 0.0006 Å |
| c | 17.629 ± 0.005 Å |
| α | 90° |
| β | 90.101 ± 0.014° |
| γ | 90° |
| Cell volume | 3003.8 ± 1.1 Å3 |
| Cell temperature | 298 K |
| Ambient diffraction temperature | 298 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.048 |
| Residual factor for significantly intense reflections | 0.0319 |
| Weighted residual factors for all reflections | 0.0814 |
| Weighted residual factors for significantly intense reflections | 0.073 |
| Goodness-of-fit parameter for all reflections | 1.002 |
| Goodness-of-fit parameter for significantly intense reflections | 1.025 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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