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Information card for entry 2004506
Preview
| Coordinates | 2004506.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Tetraphenylphosphonium-pentachlorostannat |
|---|---|
| Formula | C24 H20 Cl5 P Sn |
| Calculated formula | C24 H20 Cl5 P Sn |
| SMILES | c1ccc(cc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.Cl[Sn](Cl)(Cl)(Cl)[Cl-] |
| Title of publication | Tetraphenylphosphonium Pentachlorostannat, PPh~4~[SnCl~5~], und Tetraphenylphosphonium Pentachlorostannat Monohydrat, PPh~4~[SnCl~5~.H~2~O] |
| Authors of publication | Müller, U.; Siekmann, J. Frenzen |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 2 |
| Pages of publication | 330 - 333 |
| a | 13.113 ± 0.003 Å |
| b | 13.315 ± 0.003 Å |
| c | 7.405 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 91.39 ± 0.03° |
| Cell volume | 1292.5 ± 0.5 Å3 |
| Cell temperature | 299 ± 2 K |
| Ambient diffraction temperature | 299 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 13 |
| Hermann-Mauguin space group symbol | P 1 1 2/n |
| Hall space group symbol | -P 2ab |
| Residual factor for all reflections | 0.0753 |
| Residual factor for significantly intense reflections | 0.0496 |
| Weighted residual factors for all reflections | 0.1905 |
| Weighted residual factors for significantly intense reflections | 0.1437 |
| Goodness-of-fit parameter for all reflections | 0.141 |
| Goodness-of-fit parameter for significantly intense reflections | 0.123 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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