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Information card for entry 2004506
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Coordinates | 2004506.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Tetraphenylphosphonium-pentachlorostannat |
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Formula | C24 H20 Cl5 P Sn |
Calculated formula | C24 H20 Cl5 P Sn |
SMILES | c1ccc(cc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.Cl[Sn](Cl)(Cl)(Cl)[Cl-] |
Title of publication | Tetraphenylphosphonium Pentachlorostannat, PPh~4~[SnCl~5~], und Tetraphenylphosphonium Pentachlorostannat Monohydrat, PPh~4~[SnCl~5~.H~2~O] |
Authors of publication | Müller, U.; Siekmann, J. Frenzen |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 2 |
Pages of publication | 330 - 333 |
a | 13.113 ± 0.003 Å |
b | 13.315 ± 0.003 Å |
c | 7.405 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 91.39 ± 0.03° |
Cell volume | 1292.5 ± 0.5 Å3 |
Cell temperature | 299 ± 2 K |
Ambient diffraction temperature | 299 ± 2 K |
Number of distinct elements | 5 |
Space group number | 13 |
Hermann-Mauguin space group symbol | P 1 1 2/n |
Hall space group symbol | -P 2ab |
Residual factor for all reflections | 0.0753 |
Residual factor for significantly intense reflections | 0.0496 |
Weighted residual factors for all reflections | 0.1905 |
Weighted residual factors for significantly intense reflections | 0.1437 |
Goodness-of-fit parameter for all reflections | 0.141 |
Goodness-of-fit parameter for significantly intense reflections | 0.123 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2004506.html
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