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Information card for entry 2004522
Preview
| Coordinates | 2004522.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Tetrabutylammonium Bis(1,3-dithiol-2-thione/selone-4,5-dithioate) Nickel (II) |
|---|---|
| Formula | C38 H72 N2 Ni S9.34 Se0.66 |
| Calculated formula | C38 H72 N2 Ni S9.348 Se0.652 |
| Title of publication | A 2:1 Mixture of Tetrabutylammonium Bis(4,5-dimercapto-1,3-dithiole-2-thionato)nickelate(II) and its 2-Selenone Analogue |
| Authors of publication | Fun, H.-K.; Sivakumar, K.; Zuo, J.-L.; Yao, T.-M.; You, X.-Z. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 2 |
| Pages of publication | 312 - 315 |
| a | 8.42 ± 0.002 Å |
| b | 14.796 ± 0.002 Å |
| c | 19.504 ± 0.0001 Å |
| α | 90° |
| β | 96.22 ± 0.01° |
| γ | 90° |
| Cell volume | 2415.5 ± 0.7 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0448 |
| Residual factor for significantly intense reflections | 0.0335 |
| Weighted residual factors for all reflections | 0.0969 |
| Weighted residual factors for significantly intense reflections | 0.0921 |
| Goodness-of-fit parameter for all reflections | 1.07 |
| Goodness-of-fit parameter for significantly intense reflections | 1.15 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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