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Information card for entry 2004552
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Coordinates | 2004552.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Sodium tetraphenylcyclopentadienylate bis(dimethoxyethane) |
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Formula | C37 H41 Na O4 |
Calculated formula | C37 H41 Na O4 |
SMILES | [cH]12[c]3([c]4([c]5([c]1(c1ccccc1)[Na]162345([O](C)CC[O]1C)[O](C)CC[O]6C)c1ccccc1)c1ccccc1)c1ccccc1 |
Title of publication | Sodium Tetraphenylcyclopentadienide Bis(dimethoxyethane) |
Authors of publication | Näther, C.; Hauck, T.; Bock, H. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 3 |
Pages of publication | 570 - 572 |
a | 8.587 ± 0.001 Å |
b | 10.39 ± 0.001 Å |
c | 19.707 ± 0.003 Å |
α | 81 ± 0.01° |
β | 86.96 ± 0.01° |
γ | 69.11 ± 0.01° |
Cell volume | 1622.4 ± 0.4 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0875 |
Residual factor for significantly intense reflections | 0.0522 |
Weighted residual factors for all reflections | 0.1532 |
Weighted residual factors for significantly intense reflections | 0.13 |
Goodness-of-fit parameter for all reflections | 1.015 |
Goodness-of-fit parameter for significantly intense reflections | 1.068 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2004552.html
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