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Information card for entry 2004607
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Coordinates | 2004607.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Tetrakis(triethylammonium) hexakis(isothiocyanato)-nickel(II) |
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Formula | C30 H64 N10 Ni S6 |
Calculated formula | C30 H64 N10 Ni S6 |
SMILES | [NH+](CC)(CC)CC.[NH+](CC)(CC)CC.[NH+](CC)(CC)CC.[NH+](CC)(CC)CC.C(=N[Ni](N=C=S)(N=C=S)(N=C=S)(N=C=S)N=C=S)=S |
Title of publication | Tetrakis(triethylammonium) Hexakis(isothiocyanato-<i>N</i>)nickel(II) |
Authors of publication | Kruger, P. E.; McKee, V. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 3 |
Pages of publication | 617 - 619 |
a | 12.575 ± 0.002 Å |
b | 13.42 ± 0.001 Å |
c | 13.53 ± 0.002 Å |
α | 93.64° |
β | 93.23° |
γ | 95.23° |
Cell volume | 2264.7 ± 0.5 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 566 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0856 |
Residual factor for significantly intense reflections | 0.0552 |
Weighted residual factors for all reflections | 0.1638 |
Weighted residual factors for significantly intense reflections | 0.1355 |
Goodness-of-fit parameter for all reflections | 1.024 |
Goodness-of-fit parameter for significantly intense reflections | 1.047 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2004607.html
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