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Information card for entry 2004623
Preview
| Coordinates | 2004623.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C16 H22 F N3 O7 Se |
|---|---|
| Calculated formula | C16 H22 F N3 O7 Se |
| SMILES | [Se+](/C(=C(F)\CCC)CCC)(C)C.[O-]c1c(cc(N(=O)=O)cc1N(=O)=O)N(=O)=O |
| Title of publication | The First Structure of a Vicinal (<i>E</i>)-Fluoroselenoolefin: (<i>E</i>)-(5-Fluoro-4-octen-4-yl)dimethylselenonium Picrate |
| Authors of publication | Poleschner, H.; Schilde, U. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 3 |
| Pages of publication | 644 - 647 |
| a | 8.236 ± 0.001 Å |
| b | 11.26 ± 0.003 Å |
| c | 11.608 ± 0.003 Å |
| α | 90.3 ± 0.02° |
| β | 101.98 ± 0.01° |
| γ | 110.44 ± 0.02° |
| Cell volume | 983.2 ± 0.4 Å3 |
| Cell temperature | 210 ± 2 K |
| Ambient diffraction temperature | 210 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0378 |
| Residual factor for significantly intense reflections | 0.0299 |
| Weighted residual factors for all reflections | 0.0813 |
| Weighted residual factors for significantly intense reflections | 0.0762 |
| Goodness-of-fit parameter for all reflections | 1.021 |
| Goodness-of-fit parameter for significantly intense reflections | 1.03 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2004623.html
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Users of the data should acknowledge the original authors of the
structural data.