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Information card for entry 2004636
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Coordinates | 2004636.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Tetrakis(dimethylsulphoxide-κ-O)copper(II) bis(perchlorate) |
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Formula | C8 H24 Cl2 Cu O12 S4 |
Calculated formula | C8 H24 Cl2 Cu O12 S4 |
SMILES | [Cu]([O]=S(C)C)([O]=S(C)C)([O]=S(C)C)[O]=S(C)C.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-] |
Title of publication | Tetrakis(dimethyl sulfoxide-<i>O</i>)copper(II) Bis(perchlorate) |
Authors of publication | Blake, A. J.; Grimditch, R. S.; Parsons, S.; Schröder, M. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 3 |
Pages of publication | 514 - 516 |
a | 14.28 ± 0.003 Å |
b | 10.426 ± 0.002 Å |
c | 16.112 ± 0.004 Å |
α | 90° |
β | 112.065 ± 0.014° |
γ | 90° |
Cell volume | 2223.1 ± 0.9 Å3 |
Cell temperature | 240 ± 0.2 K |
Ambient diffraction temperature | 240 ± 0.2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/a 1 |
Hall space group symbol | -P 2yab |
Residual factor for all reflections | 0.1548 |
Residual factor for significantly intense reflections | 0.0649 |
Weighted residual factors for all reflections | 0.1349 |
Weighted residual factors for significantly intense reflections | 0.106 |
Goodness-of-fit parameter for all reflections | 0.977 |
Goodness-of-fit parameter for significantly intense reflections | 1.119 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2004636.html
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