Information card for entry 2004642
| Formula |
C9 H16 N2 Ni S5 |
| Calculated formula |
C9 H16 N2 Ni S5 |
| Title of publication |
(2-Thioxo-1,3-dithiole-4,5-dithiolato)(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethylenediamine)nickel(II) |
| Authors of publication |
Sheng, T.; Wu, X.; Huang, Q.; Wang, Q. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1996 |
| Journal volume |
52 |
| Journal issue |
3 |
| Pages of publication |
539 - 541 |
| a |
9.334 ± 0.008 Å |
| b |
11.112 ± 0.005 Å |
| c |
14.526 ± 0.009 Å |
| α |
90° |
| β |
98.14 ± 0.07° |
| γ |
90° |
| Cell volume |
1491.4 ± 1.7 Å3 |
| Cell temperature |
298 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for significantly intense reflections |
0.054 |
| Weighted residual factors for significantly intense reflections |
0.063 |
| Goodness-of-fit parameter for significantly intense reflections |
1.14 |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2004642.html