Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2004648
Preview
Coordinates | 2004648.cif |
---|---|
Original IUCr paper | HTML |
Common name | Bromo-bis(triphenylphosphine-P})-(N,N-dibutyl-N'-phenylthiourea-S) copper(I) |
---|---|
Chemical name | Bromobis(triphenylphosphine-P})-(N,N-dibutyl-N'-phenylthiourea-S) copper(I) |
Formula | C51 H54 Br Cu N2 P2 S |
Calculated formula | C51 H54 Br Cu N2 P2 S |
Title of publication | Bromo(<i>N</i>,<i>N</i>-dibutyl-<i>N</i>'-phenylthiourea-<i>S</i>)bis(triphenylphosphine-<i>P</i>)copper(I), [Cu(PPh~3~)~2~(dbptH)Br] |
Authors of publication | Singh, R.; Dikshit, S. K. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 3 |
Pages of publication | 635 - 637 |
a | 13.226 ± 0.002 Å |
b | 13.23 ± 0.002 Å |
c | 14.908 ± 0.003 Å |
α | 87.63 ± 0.01° |
β | 78.64 ± 0.02° |
γ | 66.76 ± 0.01° |
Cell volume | 2348.1 ± 0.7 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.072 |
Residual factor for significantly intense reflections | 0.037 |
Weighted residual factors for all reflections | 0.034 |
Weighted residual factors for significantly intense reflections | 0.032 |
Goodness-of-fit parameter for all reflections | 1.854 |
Goodness-of-fit parameter for significantly intense reflections | 2.225 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2004648.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.