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Information card for entry 2004703
Preview
| Coordinates | 2004703.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C6 H10 Bi La N6 O5 S6 |
|---|---|
| Calculated formula | C6 H6 Bi La N6 O5 S6 |
| Title of publication | Triaquahexathiocyanatobismuthlanthanum Dihydrate, [Bi(SCN)~6~La(H~2~O)~3~].2H~2~O, and Triaquahexathiocyanatobismuthneodymium Dihydrate, [Bi(SCN)~6~Nd(H~2~O)~3~].2H~2~O |
| Authors of publication | Maniukiewicz, W.; Sieron, L.; Bukowska-Strzyzewska, M.; Turek, A. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 4 |
| Pages of publication | 753 - 757 |
| a | 8.2508 ± 0.0006 Å |
| b | 8.2508 ± 0.0006 Å |
| c | 18.745 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 1105.12 ± 0.16 Å3 |
| Cell temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Hermann-Mauguin space group symbol | P 63/m |
| Hall space group symbol | -P 6c |
| Residual factor for all reflections | 0.0329 |
| Residual factor for significantly intense reflections | 0.0277 |
| Weighted residual factors for all reflections | 0.0593 |
| Weighted residual factors for significantly intense reflections | 0.0537 |
| Goodness-of-fit parameter for all reflections | 1.162 |
| Goodness-of-fit parameter for significantly intense reflections | 1.172 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2004703.html
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