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Information card for entry 2004769
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Coordinates | 2004769.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Iodo-tris(triphenylphosphine)silver(I) |
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Formula | C54 H45 Ag I P3 |
Calculated formula | C54 H45 Ag I P3 |
SMILES | I[Ag]([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Iodotris(triphenylphosphine)silver(I), [Ag(PPh~3~)~3~I] |
Authors of publication | Hibbs, D. E.; Hursthouse, M. B.; Malik, K. M. A.; Beckett, M. A.; Jones, P. W. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 4 |
Pages of publication | 884 - 887 |
a | 18.847 ± 0.003 Å |
b | 13.715 ± 0.002 Å |
c | 17.543 ± 0.003 Å |
α | 90° |
β | 95.93 ± 0.04° |
γ | 90° |
Cell volume | 4510.4 ± 1.3 Å3 |
Cell temperature | 140 ± 2 K |
Ambient diffraction temperature | 140 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0558 |
Residual factor for significantly intense reflections | 0.0489 |
Weighted residual factors for all reflections | 0.1177 |
Weighted residual factors for significantly intense reflections | 0.116 |
Goodness-of-fit parameter for all reflections | 1.011 |
Goodness-of-fit parameter for significantly intense reflections | 1.096 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2004769.html
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