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Information card for entry 2004887
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Coordinates | 2004887.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Tris(1,10-phenanthroline)ruthenium(II) dihexafluorophosphate |
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Formula | C36 H24 F12 N6 P2 Ru |
Calculated formula | C36 H24 F12 N6 P2 Ru |
SMILES | [Ru]123([n]4cccc5ccc6ccc[n]1c6c45)([n]1cccc4ccc5ccc[n]2c5c14)[n]1cccc2ccc4ccc[n]3c4c12.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Tris(1,10-phenanthroline)ruthenium(II) Bis(hexafluorophosphate) |
Authors of publication | Breu, J.; Stoll, A. J. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 5 |
Pages of publication | 1174 - 1177 |
a | 37.086 ± 0.009 Å |
b | 16.045 ± 0.005 Å |
c | 12.128 ± 0.005 Å |
α | 90° |
β | 101.425 ± 0.015° |
γ | 90° |
Cell volume | 7074 ± 4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0715 |
Residual factor for significantly intense reflections | 0.0435 |
Weighted residual factors for all reflections | 0.1142 |
Weighted residual factors for significantly intense reflections | 0.1039 |
Goodness-of-fit parameter for all reflections | 0.914 |
Goodness-of-fit parameter for significantly intense reflections | 1.034 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2004887.html
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