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Information card for entry 2004892
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Coordinates | 2004892.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Hexakis(N,N-dimethylformamide)-nickel(II) Diperchlorate |
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Formula | C18 H42 Cl2 N6 Ni O14 |
Calculated formula | C18 H42 Cl2 N6 Ni O14 |
SMILES | [Ni]([O]=CN(C)C)([O]=CN(C)C)([O]=CN(C)C)([O]=CN(C)C)([O]=CN(C)C)[O]=CN(C)C.[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O |
Title of publication | Hexakis(<i>N</i>,<i>N</i>-dimethylformamide)nickel(II) Diperchlorate |
Authors of publication | McKee, V.; Metcalfe, T.; Wikaira, J. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 5 |
Pages of publication | 1139 - 1141 |
a | 14.819 ± 0.001 Å |
b | 10.765 ± 0.001 Å |
c | 20.673 ± 0.002 Å |
α | 90° |
β | 92.28° |
γ | 90° |
Cell volume | 3295.3 ± 0.5 Å3 |
Cell temperature | 158 ± 2 K |
Ambient diffraction temperature | 158 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0588 |
Residual factor for significantly intense reflections | 0.0407 |
Weighted residual factors for all reflections | 0.1109 |
Weighted residual factors for significantly intense reflections | 0.0931 |
Goodness-of-fit parameter for all reflections | 1.035 |
Goodness-of-fit parameter for significantly intense reflections | 1.07 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2004892.html
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