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Information card for entry 2004904
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Coordinates | 2004904.cif |
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Original IUCr paper | HTML |
Chemical name | Bis(S-methyl-β-N-(4-methoxyphenyl)methylendithiocarbazide) nickel(II). |
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Formula | C20 H22 N4 Ni O2 S4 |
Calculated formula | C20 H22 N4 Ni O2 S4 |
SMILES | [Ni]12([N](N=C(S1)SC)=Cc1ccc(OC)cc1)[N](N=C(S2)SC)=Cc1ccc(OC)cc1 |
Title of publication | Bis[methyl <i>N</i>^{β^}-(4-methoxyphenylmethylene)dithiocarbazato]nickel(II) |
Authors of publication | Fun, H.-K.; Sivakumar, K.; Tian, Y.-P.; Duan, C.-Y.; Lu, Z.-L.; You, X.-Z. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 5 |
Pages of publication | 1143 - 1145 |
a | 8.601 ± 0.001 Å |
b | 8.768 ± 0.001 Å |
c | 15.008 ± 0.002 Å |
α | 89.32 ± 0.01° |
β | 83.97 ± 0.01° |
γ | 81.22 ± 0.01° |
Cell volume | 1112.3 ± 0.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0367 |
Residual factor for significantly intense reflections | 0.0328 |
Weighted residual factors for all reflections | 0.0942 |
Weighted residual factors for significantly intense reflections | 0.0914 |
Goodness-of-fit parameter for all reflections | 1.063 |
Goodness-of-fit parameter for significantly intense reflections | 1.109 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2004904.html
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