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Information card for entry 2004904
Preview
| Coordinates | 2004904.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bis(S-methyl-β-N-(4-methoxyphenyl)methylendithiocarbazide) nickel(II). |
|---|---|
| Formula | C20 H22 N4 Ni O2 S4 |
| Calculated formula | C20 H22 N4 Ni O2 S4 |
| SMILES | [Ni]12([N](N=C(S1)SC)=Cc1ccc(OC)cc1)[N](N=C(S2)SC)=Cc1ccc(OC)cc1 |
| Title of publication | Bis[methyl <i>N</i>^{β^}-(4-methoxyphenylmethylene)dithiocarbazato]nickel(II) |
| Authors of publication | Fun, H.-K.; Sivakumar, K.; Tian, Y.-P.; Duan, C.-Y.; Lu, Z.-L.; You, X.-Z. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 5 |
| Pages of publication | 1143 - 1145 |
| a | 8.601 ± 0.001 Å |
| b | 8.768 ± 0.001 Å |
| c | 15.008 ± 0.002 Å |
| α | 89.32 ± 0.01° |
| β | 83.97 ± 0.01° |
| γ | 81.22 ± 0.01° |
| Cell volume | 1112.3 ± 0.2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0367 |
| Residual factor for significantly intense reflections | 0.0328 |
| Weighted residual factors for all reflections | 0.0942 |
| Weighted residual factors for significantly intense reflections | 0.0914 |
| Goodness-of-fit parameter for all reflections | 1.063 |
| Goodness-of-fit parameter for significantly intense reflections | 1.109 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2004904.html
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Users of the data should acknowledge the original authors of the
structural data.