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Information card for entry 2004949
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Coordinates | 2004949.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | 5,8-Bis(trimethylsilyl)-6,7-dihydroindeno[2,1c]fluorene |
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Formula | C26 H32 Si2 |
Calculated formula | C26 H32 Si2 |
SMILES | [Si](C1=C2[C@H](c3c1cccc3)[C@H]1c3ccccc3C(=C1CC2)[Si](C)(C)C)(C)(C)C.[Si](C1=C2[C@@H](c3c1cccc3)[C@@H]1c3ccccc3C(=C1CC2)[Si](C)(C)C)(C)(C)C |
Title of publication | Cyclohexane-Linked Indenyl Rings in 5,8-Bis(trimethylsilyl)-6,7,12b,12c-tetrahydroindeno[2,1-<i>c</i>]fluorene |
Authors of publication | Olmstead, M. M.; Hitchcock, S. R.; Nantz, M. H. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 6 |
Pages of publication | 1523 - 1525 |
a | 10.082 ± 0.002 Å |
b | 10.912 ± 0.002 Å |
c | 12.228 ± 0.002 Å |
α | 98.105 ± 0.015° |
β | 108.339 ± 0.014° |
γ | 106.541 ± 0.015° |
Cell volume | 1184.1 ± 0.4 Å3 |
Cell temperature | 130 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0708 |
Residual factor for significantly intense reflections | 0.052 |
Weighted residual factors for all reflections | 0.1357 |
Weighted residual factors for significantly intense reflections | 0.1231 |
Goodness-of-fit parameter for all reflections | 1.034 |
Goodness-of-fit parameter for significantly intense reflections | 1.071 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2004949.html
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Users of the data should acknowledge the original authors of the
structural data.