Information card for entry 2004990

Structure parameters

• Formula: C14 H26 O2 Si W
• Calculated formula: C14 H26 O2 Si W
• Title of publication: Dioxo(η^5^-pentamethylcyclopentadienyl)(trimethylsilylmethyl)tungsten(VI)
• Authors of publication: Legzdins, P.; Rettig, S. J.; Sayers, S. F.
• Journal of publication: Acta Crystallographica Section C
• Year of publication: 1996
• Journal volume: 52
• Journal issue: 6
• Pages of publication: 1355 - 1357
• a: 9.45 ± 0.002 Å
• b: 12.383 ± 0.003 Å
• c: 14.453 ± 0.002 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 1691.3 ± 0.6 ų
• Cell temperature: 294.2 K
• Ambient diffraction temperature: 294.2 K
• Number of distinct elements: 5
• Space group number: 62
• Hermann-Mauguin space group symbol: P n m a
• Hall space group symbol: -P 2ac 2n
• Residual factor for all reflections: 0.0962
• Residual factor for significantly intense reflections: 0.0284
• Weighted residual factors for all reflections: 0.0313
• Weighted residual factors for significantly intense reflections: 0.0257
• Goodness-of-fit parameter for significantly intense reflections: 1.267
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No