Information card for entry 2005172
| Chemical name |
3-(Isopropylamino)-4-methyl-4H-pyrido[4,3-e]-1,2,4-thiadiazine 1,1-dioxide |
| Formula |
C10 H14 N4 O2 S |
| Calculated formula |
C10 H14 N4 O2 S |
| SMILES |
S1(=O)(=O)N=C(N(c2ccncc12)C)NC(C)C |
| Title of publication |
3-Isopropylamino-4-methyl-4<i>H</i>-pyrido[4,3-<i>e</i>][1,2,4]thiadiazine 1,1-Dioxide |
| Authors of publication |
Dupont, L.; Pirotte, B.; de Tullio, P.; Delarge, J. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1996 |
| Journal volume |
52 |
| Journal issue |
7 |
| Pages of publication |
1741 - 1743 |
| a |
6.2084 ± 0.0007 Å |
| b |
13.0294 ± 0.0014 Å |
| c |
15.0456 ± 0.0011 Å |
| α |
90° |
| β |
95.709 ± 0.006° |
| γ |
90° |
| Cell volume |
1211 ± 0.2 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0588 |
| Residual factor for significantly intense reflections |
0.0465 |
| Weighted residual factors for all reflections |
0.1519 |
| Weighted residual factors for significantly intense reflections |
0.1458 |
| Goodness-of-fit parameter for all reflections |
1.072 |
| Goodness-of-fit parameter for significantly intense reflections |
1.186 |
| Diffraction radiation wavelength |
1.5418 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/2005172.html