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Information card for entry 2005176
Preview
| Coordinates | 2005176.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C42 H42 O5 S2 |
|---|---|
| Calculated formula | C42 H42 O5 S2 |
| SMILES | S1Cc2ccc(cc2)OCc2ccc(cc2)c2cccc(c2)c2ccc(COc3ccc(CSCc4c(C1)cccc4)cc3)cc2.O.O.O |
| Title of publication | A New Cyclophane |
| Authors of publication | Kabaleeswaran, V.; Rajan, S. S.; Kannan, A.; Rajakumar, P. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 7 |
| Pages of publication | 1729 - 1731 |
| a | 11.721 ± 0.003 Å |
| b | 15.778 ± 0.002 Å |
| c | 20.879 ± 0.004 Å |
| α | 90 ± 0.02° |
| β | 90 ± 0.02° |
| γ | 90 ± 0.02° |
| Cell volume | 3861.2 ± 1.3 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.095 |
| Residual factor for significantly intense reflections | 0.07 |
| Weighted residual factors for all reflections | 0.101 |
| Weighted residual factors for significantly intense reflections | 0.077 |
| Goodness-of-fit parameter for all reflections | 1.11 |
| Goodness-of-fit parameter for significantly intense reflections | 1.04 |
| Diffraction radiation wavelength | 1.5418 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2005176.html
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Users of the data should acknowledge the original authors of the
structural data.