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Information card for entry 2005193
Preview
| Coordinates | 2005193.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bromobis(diethyldithiocarbamato)-4-methoxyphenyltellurium(IV) |
|---|---|
| Formula | C17 H27 Br N2 O S4 Te |
| Calculated formula | C17 H27 Br N2 O S4 Te |
| SMILES | C1(=[S][Te]2(S1)(Br)(c1ccc(OC)cc1)SC(=[S]2)N(CC)CC)N(CC)CC |
| Title of publication | Bromobis(diethyldithiocarbamato)(4-methoxyphenyl)tellurium(IV) |
| Authors of publication | Husebye, S.; Engebretsen, T.; Rudd, M. D.; Lindeman, S. V. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 8 |
| Pages of publication | 2022 - 2024 |
| a | 9.977 ± 0.002 Å |
| b | 14.009 ± 0.003 Å |
| c | 16.462 ± 0.003 Å |
| α | 90° |
| β | 91.21 ± 0.03° |
| γ | 90° |
| Cell volume | 2300.3 ± 0.8 Å3 |
| Cell temperature | 103 ± 2 K |
| Ambient diffraction temperature | 103 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0333 |
| Residual factor for significantly intense reflections | 0.0278 |
| Weighted residual factors for all reflections | 0.088 |
| Weighted residual factors for significantly intense reflections | 0.0748 |
| Goodness-of-fit parameter for all reflections | 1.028 |
| Goodness-of-fit parameter for significantly intense reflections | 1.05 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2005193.html
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