Information card for entry 2005214
Chemical name |
Bis(μ-thiosulphato-S,O)-bis(dimethylphenanthrolyne cadmium(II)) |
Formula |
C28 H24 Cd2 N4 O6 S4 |
Calculated formula |
C28 H24 Cd2 N4 O6 S4 |
Title of publication |
Bis(μ-thiosulfato)-1κ<i>O</i>,1:2κ^2^<i>S</i>;2κ<i>O</i>,1:2κ^2^<i>S</i>-bis[(2,9-dimethyl-1,10-phenanthroline-<i>N</i>,<i>N</i>')cadmium(II)] |
Authors of publication |
Baggio, R.; Baggio, S.; Pardo, M. I.; Garland, M. T. |
Journal of publication |
Acta Crystallographica Section C |
Year of publication |
1996 |
Journal volume |
52 |
Journal issue |
8 |
Pages of publication |
1939 - 1942 |
a |
8.439 ± 0.001 Å |
b |
16.864 ± 0.002 Å |
c |
11.01 ± 0.001 Å |
α |
90° |
β |
109.56 ± 0.01° |
γ |
90° |
Cell volume |
1476.5 ± 0.3 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
6 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/n 1 |
Hall space group symbol |
-P 2yn |
Residual factor for all reflections |
0.0311 |
Residual factor for significantly intense reflections |
0.0252 |
Weighted residual factors for all reflections |
0.0638 |
Weighted residual factors for significantly intense reflections |
0.0591 |
Goodness-of-fit parameter for all reflections |
1.056 |
Goodness-of-fit parameter for significantly intense reflections |
1.067 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2005214.html