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Information card for entry 2005244
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Coordinates | 2005244.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | (OC-6-2'3'-C)-Chlorobis[2-(diphenylphosphino)phenolato]oxorhenium(V) |
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Formula | C36 H28 Cl O3 P2 Re |
Calculated formula | C36 H28 Cl O3 P2 Re |
SMILES | [Re]12(Cl)(=O)(Oc3c(cccc3)[P]1(c1ccccc1)c1ccccc1)Oc1c(cccc1)[P]2(c1ccccc1)c1ccccc1 |
Title of publication | Chlorobis[2-(diphenylphosphino)phenolato-<i>O</i>,<i>P</i>]oxorhenium(V) |
Authors of publication | Loiseau, F.; Lucchese, Y.; Dartiguenave, M.; Bélanger-Gariépy, F.; Beauchamp, A. L. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 8 |
Pages of publication | 1968 - 1971 |
a | 10.223 ± 0.003 Å |
b | 14.096 ± 0.003 Å |
c | 21.454 ± 0.008 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3091.6 ± 1.6 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0393 |
Residual factor for significantly intense reflections | 0.031 |
Weighted residual factors for all reflections | 0.065 |
Weighted residual factors for significantly intense reflections | 0.0625 |
Goodness-of-fit parameter for all reflections | 0.74 |
Goodness-of-fit parameter for significantly intense reflections | 0.781 |
Diffraction radiation wavelength | 1.54056 Å |
Diffraction radiation type | CopperKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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