Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2005247
Preview
Coordinates | 2005247.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | {trans-2,2,4,4-Tetrafluoro-1,3-diphenyl-1,3-diphosphetane} -bis(pentacarbonylchromium(0)) |
---|---|
Formula | C24 H10 Cr2 F4 O10 P2 |
Calculated formula | C24 H10 Cr2 F4 O10 P2 |
SMILES | [P]1(C(F)(F)[P](C1(F)F)(c1ccccc1)[Cr](C#[O])(C#[O])(C#[O])(C#[O])C#[O])(c1ccccc1)[Cr](C#[O])(C#[O])(C#[O])(C#[O])C#[O] |
Title of publication | <i>trans</i>-2,2,4,4-Tetrafluoro-1,3-diphenyl-1,3-diphosphetanediyl-1,3-bis[pentacarbonylchromium(0)] |
Authors of publication | Jones, P. G. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 8 |
Pages of publication | 1919 - 1921 |
a | 8.427 ± 0.002 Å |
b | 9.043 ± 0.002 Å |
c | 10.195 ± 0.002 Å |
α | 115.61 ± 0.02° |
β | 102.39 ± 0.02° |
γ | 90.07 ± 0.02° |
Cell volume | 680.4 ± 0.3 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0232 |
Residual factor for significantly intense reflections | 0.0219 |
Weighted residual factors for all reflections | 0.0632 |
Weighted residual factors for significantly intense reflections | 0.059 |
Goodness-of-fit parameter for all reflections | 1.08 |
Goodness-of-fit parameter for significantly intense reflections | 1.087 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2005247.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.