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Information card for entry 2005278
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| Coordinates | 2005278.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bis(N,N'-dimethylthiourea)silver(I) Perchlorate. |
|---|---|
| Formula | C6 H16 Ag Cl N4 O4 S2 |
| Calculated formula | C6 H16 Ag Cl N4 O8 S2 |
| Title of publication | Bis(<i>N</i>,<i>N</i>'-dimethylthiourea-<i>S</i>)silver(I) Perchlorate and Tris(<i>N</i>,<i>N</i>'-dimethylthiourea-<i>S</i>)silver(I) Perchlorate |
| Authors of publication | Pakawatchai, C.; Sivakumar, K.; Fun, H.-K. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 8 |
| Pages of publication | 1954 - 1957 |
| a | 6.397 ± 0.001 Å |
| b | 10.405 ± 0.001 Å |
| c | 12.347 ± 0.001 Å |
| α | 69.78 ± 0.01° |
| β | 85.58 ± 0.01° |
| γ | 78.77 ± 0.01° |
| Cell volume | 756.37 ± 0.16 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.046 |
| Residual factor for significantly intense reflections | 0.0384 |
| Weighted residual factors for all reflections | 0.1148 |
| Weighted residual factors for significantly intense reflections | 0.1104 |
| Goodness-of-fit parameter for all reflections | 1.044 |
| Goodness-of-fit parameter for significantly intense reflections | 1.114 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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