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Information card for entry 2005352
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Coordinates | 2005352.cif |
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Original IUCr paper | HTML |
Chemical name | [1,1,1,5,5,5-hexafluoro-2,4-bis(trifluoromethyl)3-oxa- 2,4-diolatopentane][N,N,N,N-tetramethylethylenediamine]copper(II) |
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Formula | C12 H16 Cu F12 N2 O3 |
Calculated formula | C12 H16 Cu F12 N2 O3 |
SMILES | [Cu]12(OC(OC(O1)(C(F)(F)F)C(F)(F)F)(C(F)(F)F)C(F)(F)F)[N](CC[N]2(C)C)(C)C |
Title of publication | A Condensed Dialkoxide Complex of Copper(II), [(CH~3~)~2~NCH~2~CH~2~N(CH~3~)~2~]Cu[{OC(CF~3~)~2~}~2~O] |
Authors of publication | Hynes, R. C.; Willis, C. J.; Payne, N. C. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 9 |
Pages of publication | 2173 - 2176 |
a | 9.9019 ± 0.0014 Å |
b | 12.2972 ± 0.0015 Å |
c | 8.9716 ± 0.0012 Å |
α | 108.28 ± 0.02° |
β | 110.66 ± 0.02° |
γ | 86.16 ± 0.02° |
Cell volume | 969.4 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 1 |
Hermann-Mauguin space group symbol | P 1 |
Hall space group symbol | P 1 |
Residual factor for all reflections | 0.0552 |
Residual factor for significantly intense reflections | 0.0401 |
Weighted residual factors for all reflections | 0.1022 |
Weighted residual factors for significantly intense reflections | 0.0936 |
Goodness-of-fit parameter for all reflections | 1.035 |
Goodness-of-fit parameter for significantly intense reflections | 1.03 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2005352.html
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