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Information card for entry 2005497
Preview
| Coordinates | 2005497.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C50 H37 Hf N5 O4 |
|---|---|
| Calculated formula | C50 H37 Hf N5 O4 |
| SMILES | c12=C(c3ccc4C(=c5ccc6C(=c7ccc8=C(c([n]1[Hf]19(n78)(OC(=[O]1)C)([n]56)(n34)OC(=[O]9)C)cc2)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1.N#CC |
| Title of publication | (Tetraphenylporphyrinato)hafnium(IV) Diacetate Acetonitrile Solvate |
| Authors of publication | Huhmann, J. L.; Rath, N. P.; Corey, J. Y. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 10 |
| Pages of publication | 2486 - 2488 |
| a | 17.754 ± 0.009 Å |
| b | 16.129 ± 0.007 Å |
| c | 14.99 ± 0.005 Å |
| α | 90° |
| β | 103.33 ± 0.03° |
| γ | 90° |
| Cell volume | 4177 ± 3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1375 |
| Residual factor for significantly intense reflections | 0.078 |
| Weighted residual factors for all reflections | 0.1096 |
| Weighted residual factors for significantly intense reflections | 0.092 |
| Goodness-of-fit parameter for all reflections | 1.376 |
| Goodness-of-fit parameter for significantly intense reflections | 1.527 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.