Information card for entry 2005614
| Chemical name |
cis-4,5-Dihydroxy-2,3,4,5-tetraphenylcyclopent-2-en-1-one |
| Formula |
C29 H22 O3 |
| Calculated formula |
C29 H22 O3 |
| SMILES |
O=C1C(=C([C@](O)([C@@]1(O)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1.O=C1C(=C([C@@](O)([C@]1(O)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication |
<i>cis</i>-4,5-Dihydroxy-2,3,4,5-tetraphenylcyclopent-2-enone |
| Authors of publication |
Jedrzejas, M. J.; Rubin, M. D.; Baker, R. J.; Masnovi, J.; Towns, R. L. R. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1996 |
| Journal volume |
52 |
| Journal issue |
11 |
| Pages of publication |
2936 - 2939 |
| a |
24.856 ± 0.005 Å |
| b |
22.041 ± 0.005 Å |
| c |
7.921 ± 0.003 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
4340 ± 2 Å3 |
| Cell temperature |
293 K |
| Ambient diffraction temperature |
293 K |
| Number of distinct elements |
3 |
| Space group number |
56 |
| Hermann-Mauguin space group symbol |
P c c n |
| Hall space group symbol |
-P 2ab 2ac |
| Residual factor for all reflections |
0.081 |
| Residual factor for significantly intense reflections |
0.081 |
| Weighted residual factors for all reflections |
0.058 |
| Weighted residual factors for significantly intense reflections |
0.058 |
| Goodness-of-fit parameter for all reflections |
0.99 |
| Goodness-of-fit parameter for significantly intense reflections |
0.99 |
| Diffraction radiation wavelength |
0.7093 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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