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Information card for entry 2005620
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Coordinates | 2005620.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | S-(trans-3-methyloxiran-2-yl)-S-phenyl-N-(p-tolylsulfonyl)sulfoximide |
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Formula | C16 H17 N O4 S2 |
Calculated formula | C16 H17 N O4 S2 |
SMILES | S(=NS(=O)(=O)c1ccc(cc1)C)(=O)([C@@H]1O[C@H]1C)c1ccccc1.S(=NS(=O)(=O)c1ccc(cc1)C)(=O)([C@H]1O[C@@H]1C)c1ccccc1 |
Title of publication | A Sulfoximidooxirane |
Authors of publication | Clegg, W.; Elsegood, M. R. J.; Jackson, R. F. W.; Bailey, P. L.; Briggs, A. D. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 11 |
Pages of publication | 2781 - 2783 |
a | 16.149 ± 0.008 Å |
b | 12.969 ± 0.008 Å |
c | 17.075 ± 0.009 Å |
α | 90° |
β | 110.59 ± 0.04° |
γ | 90° |
Cell volume | 3348 ± 3 Å3 |
Cell temperature | 160 ± 2 K |
Ambient diffraction temperature | 160 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0812 |
Residual factor for significantly intense reflections | 0.0395 |
Weighted residual factors for all reflections | 0.1242 |
Weighted residual factors for significantly intense reflections | 0.0967 |
Goodness-of-fit parameter for all reflections | 1.074 |
Goodness-of-fit parameter for significantly intense reflections | 1.054 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2005620.html
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