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Information card for entry 2005652
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| Coordinates | 2005652.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bis(tetraethylammonium)-tetrachloromercurate |
|---|---|
| Formula | C16 H40 Cl4 Hg N2 |
| Calculated formula | C16 H40 Cl4 Hg N2 |
| Title of publication | Bis(tetraethylammonium) Tetrachlorometallates, [(C~2~H~5~)~4~N]~2~[<i>M</i>Cl~4~], where <i>M</i> = Hg, Cd, Zn |
| Authors of publication | Mahoui, A.; Lapasset, J.; Moret, J.; Saint Grégoire, P. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 11 |
| Pages of publication | 2671 - 2674 |
| a | 8.962 ± 0.002 Å |
| b | 8.962 ± 0.002 Å |
| c | 15.439 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1240 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 137 |
| Hermann-Mauguin space group symbol | P 42/n m c :2 |
| Hall space group symbol | -P 4ac 2a |
| Residual factor for all reflections | 0.1181 |
| Residual factor for significantly intense reflections | 0.0299 |
| Weighted residual factors for all reflections | 0.0862 |
| Weighted residual factors for significantly intense reflections | 0.0676 |
| Goodness-of-fit parameter for all reflections | 0.886 |
| Goodness-of-fit parameter for significantly intense reflections | 1.033 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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