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Information card for entry 2005913
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Coordinates | 2005913.cif |
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Original IUCr paper | HTML |
Chemical name | Bis(tetraethylammonium) bis(μ-sulfido)-bis[(1,2,3,4-tetrathiabutan-1,4-diyl-S,S)thiotungstate(V)] |
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Formula | C16 H40 N2 S12 W2 |
Calculated formula | C16 H30 N2 S12 W2 |
Title of publication | Disorder in Bis(tetraethylammonium) Bis(μ-sulfido)bis[(1,2,3,4-tetrathiabutane-1,4-diyl-<i>S</i>,<i>S</i>)thiotungstate(V)] |
Authors of publication | Mukherjee, A. K.; Das, P. K.; Mukherjee, M.; Chakraborty, P. K.; Bhattacharya, R. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1997 |
Journal volume | 53 |
Journal issue | 2 |
Pages of publication | 209 - 212 |
a | 21.174 ± 0.004 Å |
b | 21.174 ± 0.004 Å |
c | 15.119 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6778 ± 2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 120 |
Hermann-Mauguin space group symbol | I -4 c 2 |
Hall space group symbol | I -4 -2c |
Residual factor for all reflections | 0.0676 |
Residual factor for significantly intense reflections | 0.0484 |
Weighted residual factors for all reflections | 0.1244 |
Weighted residual factors for significantly intense reflections | 0.1139 |
Goodness-of-fit parameter for all reflections | 1.044 |
Goodness-of-fit parameter for significantly intense reflections | 1.09 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/2005913.html
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