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Information card for entry 2005919
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Coordinates | 2005919.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Ba~6~V~4~O~5~S~11~ |
---|---|
Formula | Ba6 O5 S11 V4 |
Calculated formula | Ba6 O5 S11 V4 |
SMILES | [Ba+2].[Ba+2].[Ba+2].[Ba+2].[Ba+2].[Ba+2].[S-][V](=S)([S-])[O-].[S-][V]([S-])([S-])=S.[V](=S)([S-])([O-])[O-].[V](=S)([S-])([O-])[O-] |
Title of publication | Ba~6~V~4~O~5~S~11~ |
Authors of publication | Litteer, J. B.; Fettinger, J. C.; Eichhorn, B. W. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1997 |
Journal volume | 53 |
Journal issue | 2 |
Pages of publication | 163 - 165 |
a | 23.2581 ± 0.0013 Å |
b | 13.8504 ± 0.0006 Å |
c | 7.5293 ± 0.0005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2425.4 ± 0.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 62 |
Hermann-Mauguin space group symbol | P n m a |
Hall space group symbol | -P 2ac 2n |
Residual factor for all reflections | 0.0464 |
Residual factor for significantly intense reflections | 0.0394 |
Weighted residual factors for all reflections | 0.1023 |
Weighted residual factors for significantly intense reflections | 0.0979 |
Goodness-of-fit parameter for all reflections | 1.061 |
Goodness-of-fit parameter for significantly intense reflections | 1.089 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2005919.html
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Users of the data should acknowledge the original authors of the
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