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Information card for entry 2005991
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Coordinates | 2005991.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Chlorobis(dimethylphenylphosphine){bis(thiodiphenylphosphino)amido-S,S'}- nitridorhenium(V) |
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Formula | C40 H42 Cl N2 P4 Re S2 |
Calculated formula | C40 H42 Cl N2 P4 Re S2 |
SMILES | [Re]1(Cl)(#N)([P](c2ccccc2)(C)C)([P](c2ccccc2)(C)C)SP(=NP(=[S]1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | [Bis(thiodiphenylphosphino-<i>S</i>)amido]chlorobis(dimethylphenylphosphine-<i>P</i>)nitridorhenium(V) |
Authors of publication | Abram, U.; Schulz Lang, E.; Dilworth, J. R. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1997 |
Journal volume | 53 |
Journal issue | 3 |
Pages of publication | 289 - 292 |
a | 10.476 ± 0.001 Å |
b | 19.543 ± 0.003 Å |
c | 20.69 ± 0.003 Å |
α | 74.32 ± 0.07° |
β | 89.44 ± 0.07° |
γ | 81.22 ± 0.06° |
Cell volume | 4028.3 ± 1.8 Å3 |
Cell temperature | 203 ± 2 K |
Ambient diffraction temperature | 203 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0812 |
Residual factor for significantly intense reflections | 0.044 |
Weighted residual factors for all reflections | 0.1045 |
Weighted residual factors for significantly intense reflections | 0.0846 |
Goodness-of-fit parameter for all reflections | 1.122 |
Goodness-of-fit parameter for significantly intense reflections | 1.087 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2005991.html
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