Information card for entry 2006013
| Formula |
C20 H23 Cl O6 Si |
| Calculated formula |
C20 H23 Cl O6 Si |
| SMILES |
Cl[C@@]12[C@@](OC(=O)C)(CC(=C[C@@H]1OC)O[Si](C)(C)C)C(=O)c1c(C2=O)cccc1 |
| Title of publication |
(1α,4aβ,9aβ)-4a-Acetoxy-9a-chloro-1-methoxy-3-trimethylsiloxy-1,4,4a,9,9a,10-hexahydroanthracene-9,10-dione |
| Authors of publication |
White, J. M.; Riches, A. G.; Cameron, D. W.; Griffiths, P. G. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1997 |
| Journal volume |
53 |
| Journal issue |
3 |
| Pages of publication |
386 - 387 |
| a |
8.137 ± 0.002 Å |
| b |
12.363 ± 0.002 Å |
| c |
10.537 ± 0.002 Å |
| α |
90 ± 0.02° |
| β |
98.77 ± 0.02° |
| γ |
90 ± 0.02° |
| Cell volume |
1047.6 ± 0.4 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.0438 |
| Residual factor for significantly intense reflections |
0.0397 |
| Weighted residual factors for all reflections |
0.1046 |
| Weighted residual factors for significantly intense reflections |
0.0977 |
| Goodness-of-fit parameter for all reflections |
1.235 |
| Goodness-of-fit parameter for significantly intense reflections |
1.196 |
| Diffraction radiation wavelength |
1.5418 Å |
| Diffraction radiation type |
CuKα(Nifiltered) |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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