Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2006342
Preview
Coordinates | 2006342.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | (6Z,8Z)-2,4,6-Trimethyl-8-phenyl-7-oxa-2,4-diazabicyclo[4.2.0]octane-3,5-dione |
---|---|
Formula | C14 H16 N2 O3 |
Calculated formula | C14 H16 N2 O3 |
SMILES | c1ccccc1[C@@H]1O[C@@]2([C@H]1N(C(=O)N(C2=O)C)C)C.c1ccccc1[C@H]1O[C@]2([C@@H]1N(C(=O)N(C2=O)C)C)C |
Title of publication | (6<i>Z</i>,8<i>Z</i>)-2,4,6-Trimethyl-8-phenyl-7-oxa-2,4-diazabicyclo[4.2.0]octane-3,5-dione |
Authors of publication | Prakash, Gautam; Fettinger, James C.; Falvey, Daniel E. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1997 |
Journal volume | 53 |
Journal issue | 7 |
Pages of publication | 979 - 981 |
a | 8.9803 ± 0.0008 Å |
b | 16.3083 ± 0.001 Å |
c | 9.2752 ± 0.0007 Å |
α | 90° |
β | 93.541 ± 0.007° |
γ | 90° |
Cell volume | 1355.79 ± 0.18 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0597 |
Residual factor for significantly intense reflections | 0.0422 |
Weighted residual factors for all reflections | 0.1083 |
Weighted residual factors for significantly intense reflections | 0.0967 |
Goodness-of-fit parameter for all reflections | 1.038 |
Goodness-of-fit parameter for significantly intense reflections | 1.066 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2006342.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.