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Information card for entry 2006349
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Coordinates | 2006349.cif |
---|---|
Original IUCr paper | HTML |
External links | ChemSpider |
Chemical name | Triphenylsilyl(thiophenyl-2)triphenylphosphonium perrhenate dichloromethane solvate |
---|---|
Formula | C43 H36 Cl2 O4 P Re S Si |
Calculated formula | C43 H36 Cl2 O4 P Re S Si |
SMILES | [Re](=O)(=O)(=O)[O-].S([P+](c1ccccc1)(c1ccccc1)c1ccccc1)c1c([Si](c2ccccc2)(c2ccccc2)c2ccccc2)cccc1.C(Cl)Cl |
Title of publication | Triphenyl[2-(triphenylsilyl)phenylthio]phosphonium Tetraoxorhenate(1‒)‒Dichloromethane (1/1) |
Authors of publication | Miller, John R.; Lu, Canzhong; Zheng, Yifan |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1997 |
Journal volume | 53 |
Journal issue | 8 |
Pages of publication | 1039 - 1041 |
a | 10.055 ± 0.003 Å |
b | 22.575 ± 0.004 Å |
c | 18.227 ± 0.005 Å |
α | 90° |
β | 99.359 ± 0.012° |
γ | 90° |
Cell volume | 4082.3 ± 1.8 Å3 |
Cell temperature | 291 ± 1 K |
Ambient diffraction temperature | 291 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0702 |
Residual factor for significantly intense reflections | 0.0308 |
Weighted residual factors for all reflections | 0.0892 |
Weighted residual factors for significantly intense reflections | 0.076 |
Goodness-of-fit parameter for all reflections | 1.03 |
Goodness-of-fit parameter for significantly intense reflections | 1.073 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2006349.html
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