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Information card for entry 2006450
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Coordinates | 2006450.cif |
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Original IUCr paper | HTML |
Common name | [Mo(CO)(dpepp)(dppm)] (dppm = Ph~2~PCH~2~PPh~2~, dpepp = Ph~2~PCH~2~CH~2~P(Ph)CH~2~CH~2~PPh~2~) |
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Chemical name | carbonyl[bis[2-(diphenylphosphino)ethyl)]phenylphosphine- P,P',P''][methylenebis(diphenylphosphino)- P,P']molybdenum(0) |
Formula | C60 H55 Mo O P5 |
Calculated formula | C60 H55 Mo O P5 |
Title of publication | [Mo(C~25~H~22~P~2~)(C~34~H~33~P~3~)(CO)] |
Authors of publication | George, T. Adrian; DeBord, Jeffrey R. D.; Heier, Kevin; Tisdale, Robert C.; Davies, Marcia C.; Haas, Eric J.; Ross II, Charles R.; Stezowski, John J. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1997 |
Journal volume | 53 |
Journal issue | 9 |
Pages of publication | 1251 - 1254 |
a | 12.108 ± 0.002 Å |
b | 12.155 ± 0.002 Å |
c | 18.884 ± 0.004 Å |
α | 104.37 ± 0.03° |
β | 100.67 ± 0.03° |
γ | 100.8 ± 0.03° |
Cell volume | 2565 ± 1 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0821 |
Residual factor for significantly intense reflections | 0.051 |
Weighted residual factors for all reflections | 0.134 |
Weighted residual factors for significantly intense reflections | 0.116 |
Goodness-of-fit parameter for all reflections | 1.02 |
Goodness-of-fit parameter for significantly intense reflections | 1.05 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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