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Information card for entry 2006659
Preview
Coordinates | 2006659.cif |
---|---|
Original IUCr paper | HTML |
Formula | C12 H50 Ga2 N8 O20 P4 |
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Calculated formula | C12 H42 Ga2 N8 O20 P4 |
SMILES | C(C[NH3+])N(CC[NH3+])CC[NH3+].O1[Ga](O)(OP(=O)([O-])[O-])OP(=O)([O-])O[Ga](OP(=O)([O-])[O-])(OP1(=O)[O-])O.O.C(C[NH3+])N(CC[NH3+])CC[NH3+].O |
Title of publication | A New Gallium Phosphate Templated by Tris(2-aminoethyl)amine: [Ga(HPO~4~)(PO~4~)(OH)].[(C~2~H~7~ N)~3~N].H~2~O |
Authors of publication | Serpaggi, Fabien; Loiseau, Thierry; Férey, Gérard |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1997 |
Journal volume | 53 |
Journal issue | 11 |
Pages of publication | 1568 - 1570 |
a | 9.4881 ± 0.001 Å |
b | 10.3231 ± 0.0011 Å |
c | 16.3226 ± 0.0011 Å |
α | 90° |
β | 90.423 ± 0.006° |
γ | 90° |
Cell volume | 1598.7 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.078 |
Residual factor for significantly intense reflections | 0.042 |
Weighted residual factors for all reflections | 0.133 |
Weighted residual factors for significantly intense reflections | 0.12 |
Goodness-of-fit parameter for all reflections | 0.955 |
Goodness-of-fit parameter for significantly intense reflections | 1.056 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2006659.html
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