Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2007679
Preview
Coordinates | 2007679.cif |
---|---|
Original IUCr paper | HTML |
Formula | C30 H42 Si3 |
---|---|
Calculated formula | C30 H42 Si3 |
SMILES | [Si]123C[C@H]([C@@H]([Si](C1=C(C(=C2[Si]([C@H]([C@@H](C3)C)C)(C)C)c1ccccc1)c1ccccc1)(C)C)C)C.[Si]123C[C@@H]([C@H]([Si](C1=C(C(=C2[Si]([C@@H]([C@H](C3)C)C)(C)C)c1ccccc1)c1ccccc1)(C)C)C)C |
Title of publication | A Tricyclic Trisiladiene |
Authors of publication | Teng, Zhu; Stoeckli-Evans, Helen; Keese, Reinhart |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1998 |
Journal volume | 54 |
Journal issue | 10 |
Pages of publication | 1473 - 1475 |
a | 12.617 ± 0.0011 Å |
b | 13.5333 ± 0.0015 Å |
c | 18.8645 ± 0.0016 Å |
α | 79.129 ± 0.012° |
β | 79.32 ± 0.01° |
γ | 73.004 ± 0.011° |
Cell volume | 2995.9 ± 0.5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0797 |
Residual factor for significantly intense reflections | 0.0461 |
Weighted residual factors for all reflections included in the refinement | 0.1291 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.86 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2007679.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.