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Information card for entry 2007706
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Coordinates | 2007706.cif |
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Original IUCr paper | HTML |
Chemical name | 3,3'-[Ethanediylbis(aminomethylene)]bis(pentane-2,4-dione) |
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Formula | C14 H20 N2 O4 |
Calculated formula | C14 H20 N2 O4 |
SMILES | CC(=O)C(=CNCCNC=C(C(=O)C)C(=O)C)C(=O)C |
Title of publication | 3,3'-[Ethane-1,2-diylbis(aminomethylene)]bis(pentane-2,4-dione) and the Nickel(II) Complex of a Condensation Product |
Authors of publication | König, Burkhard; Pelka, Mario; Dix, Ina; Jones, Peter G. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1998 |
Journal volume | 54 |
Journal issue | 10 |
Pages of publication | 1468 - 1471 |
a | 13.756 ± 0.002 Å |
b | 8.9663 ± 0.0014 Å |
c | 11.6831 ± 0.0018 Å |
α | 90° |
β | 99.828 ± 0.01° |
γ | 90° |
Cell volume | 1419.9 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.066 |
Residual factor for significantly intense reflections | 0.04 |
Weighted residual factors for all reflections | 0.093 |
Weighted residual factors for significantly intense reflections | 0.087 |
Goodness-of-fit parameter for all reflections | 0.909 |
Goodness-of-fit parameter for significantly intense reflections | 1.047 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2007706.html
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