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Information card for entry 2007894
Preview
| Coordinates | 2007894.cif |
|---|---|
| Original IUCr paper | HTML |
| External links | PubChem |
| Chemical name | Bromo(hydrido)ethylbis(3,4-dimethylpyridine-N)silicon Bromide |
|---|---|
| Formula | C16 H24 Br2 N2 Si |
| Calculated formula | C16 H24 Br2 N2 Si |
| SMILES | [SiH](Br)(CC)([n]1cc(C)c(C)cc1)[n]1cc(C)c(C)cc1.[Br-] |
| Title of publication | Bromo(ethyl)hydridobis(3,4-dimethylpyridine-<i>N</i>)silicon Bromide at 173K |
| Authors of publication | Hensen, Karl; Kettner, Markus; Bolte, Michael |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1998 |
| Journal volume | 54 |
| Journal issue | 12 |
| Pages of publication | 1863 - 1865 |
| a | 33.756 ± 0.002 Å |
| b | 7.391 ± 0.0004 Å |
| c | 17.087 ± 0.001 Å |
| α | 90° |
| β | 118.42 ± 0.001° |
| γ | 90° |
| Cell volume | 3749.3 ± 0.4 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.065 |
| Residual factor for significantly intense reflections | 0.038 |
| Weighted residual factors for all reflections | 0.082 |
| Weighted residual factors for significantly intense reflections | 0.072 |
| Weighted residual factors for all reflections included in the refinement | 0.082 |
| Goodness-of-fit parameter for all reflections | 1.052 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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