Clegg, William; Teat, Simon J.; Prasad, Korlakunte V. R.; Ristic, Radoljub I.; Sheen, David B.; Shepherd, Evelyn A.; Sherwood, John N.; Vrcelj, Ranko M.; Shepherd, Evelyn A.
Journal of publication
Acta Crystallographica Section C
Year of publication
1998
Journal volume
54
Journal issue
12
Pages of publication
1881 - 1882
a
7.617 ± 0.003 Å
b
15.433 ± 0.006 Å
c
13.652 ± 0.005 Å
α
90°
β
90.112 ± 0.01°
γ
90°
Cell volume
1604.8 ± 1.1 Å3
Cell temperature
295 ± 2 K
Ambient diffraction temperature
295 ± 2 K
Number of distinct elements
4
Space group number
15
Hermann-Mauguin space group symbol
C 1 2/c 1
Hall space group symbol
-C 2yc
Residual factor for all reflections
0.078
Residual factor for significantly intense reflections
0.062
Weighted residual factors for all reflections included in the refinement
0.158
Goodness-of-fit parameter for all reflections included in the refinement