Information card for entry 2008079
Chemical name |
4-Methyl-7,7a,13a,14-tetrahydrobenzo[1,4]dioxino[2,3;6,7]naphtho[1,2-b] pyran-2-one. |
Formula |
C20 H16 O4 |
Calculated formula |
C20 H16 O4 |
SMILES |
o1c(=O)cc(c2ccc3c(c12)C[C@H]1[C@@H](C3)Oc2c(O1)cccc2)C.o1c(=O)cc(c2ccc3c(c12)C[C@@H]1[C@H](C3)Oc2c(O1)cccc2)C |
Title of publication |
4-Methyl-7,7a,13a,14-tetrahydrobenzo[<i>e</i>]pyrano[2',3':5,6]naphtho[2,3-<i>b</i>][1,4]dioxin-2-one |
Authors of publication |
Kandasamy Chinnakali; Hoong-Kun Fun; Kamaraj Sriraghavan; Vayalakkavoor T.Ramakrishnan; Ibrahim Abdul Razak |
Journal of publication |
Acta Crystallographica Section C |
Year of publication |
1999 |
Journal volume |
55 |
Journal issue |
1 |
Pages of publication |
91 - 92 |
a |
57.344 ± 0.002 Å |
b |
9.7802 ± 0.0004 Å |
c |
10.6263 ± 0.0005 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
5959.6 ± 0.4 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
3 |
Space group number |
43 |
Hermann-Mauguin space group symbol |
F d d 2 |
Hall space group symbol |
F 2 -2d |
Residual factor for all reflections |
0.1142 |
Residual factor for significantly intense reflections |
0.0653 |
Weighted residual factors for all reflections |
0.1547 |
Weighted residual factors for significantly intense reflections |
0.1317 |
Goodness-of-fit parameter for all reflections |
1.042 |
Goodness-of-fit parameter for significantly intense reflections |
1.134 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2008079.html