Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2008168
Preview
Coordinates | 2008168.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Tris(tetraethylammonium)tetrakis(thiophenolato-μ~3~- selenido-iron) |
---|---|
Formula | C48 H80 Fe4 N3 S4 Se4 |
Calculated formula | C48 H80 Fe4 N3 S4 Se4 |
SMILES | c1(ccccc1)S[Fe]12345[Se]6[Fe]7892(Sc2ccccc2)[Fe]2%101(Sc1ccccc1)([Fe]367(Sc1ccccc1)([Se]52)[Se]9%10)[Se]48.[N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC |
Title of publication | Tris(tetraethylammonium) tetra-μ~3~-selenido-tetrakis[(thiophenolato-<i>S</i>)iron] |
Authors of publication | Hauptmann, Ralf; Schneider, Jörg; Chen, Changneng; Henkel, Gerald |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1999 |
Journal volume | 55 |
Journal issue | 2 |
Pages of publication | 192 - 194 |
a | 24.49 ± 0.005 Å |
b | 39.314 ± 0.008 Å |
c | 11.808 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 11369 ± 4 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 6 |
Space group number | 43 |
Hermann-Mauguin space group symbol | F d d 2 |
Hall space group symbol | F 2 -2d |
Residual factor for significantly intense reflections | 0.0366 |
Weighted residual factors for all reflections included in the refinement | 0.0824 |
Goodness-of-fit parameter for significantly intense reflections | 1.08 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2008168.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.