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Information card for entry 2008200
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Coordinates | 2008200.cif |
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Original IUCr paper | HTML |
Common name | Nickel(II) Thiocyanate complex of Bis( 3 - Aminopropyl) methylamine |
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Chemical name | Nickel(II) Thiocyanate complex of Bis( 3 - Aminopropyl) methylamine |
Formula | C18 H38 N10 Ni2 S4 |
Calculated formula | C18 H38 N10 Ni2 S4 |
SMILES | C1CC[N]2(C)CCC[NH2][Ni]32([NH2]1)(N=C=[S][Ni]12([NH2]CCC[N]1(C)CCC[NH2]2)(N=C=[S]3)N=C=S)N=C=S |
Title of publication | A dimeric form of the nickel(II) thiocyanate complex of bis(3-aminopropyl)methylamine |
Authors of publication | Mukherjee, Alok K.; Nayak, Nirmalya P.; Mondal, Arunendu; Chaudhuri, Nirmalendu Ray |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1999 |
Journal volume | 55 |
Journal issue | 3 |
Pages of publication | 365 - 368 |
a | 7.72 ± 0.006 Å |
b | 13.72 ± 0.001 Å |
c | 15.161 ± 0.003 Å |
α | 63.3 ± 0.01° |
β | 88.1 ± 0.05° |
γ | 86.56 ± 0.05° |
Cell volume | 1432 ± 1.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.05 |
Residual factor for significantly intense reflections | 0.039 |
Weighted residual factors for all reflections | 0.099 |
Weighted residual factors for significantly intense reflections | 0.095 |
Goodness-of-fit parameter for all reflections | 1.216 |
Goodness-of-fit parameter for significantly intense reflections | 1.277 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2008200.html
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