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Information card for entry 2008342
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Coordinates | 2008342.cif |
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Original IUCr paper | HTML |
Chemical name | Chloro(diethyl dithiophosphato-S,S')(triphenylphosphine-P)palladium(II) |
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Formula | C22 H25 Cl O2 P2 Pd S2 |
Calculated formula | C22 H25 Cl O2 P2 Pd S2 |
SMILES | [Pd]1(SP(=[S]1)(OCC)OCC)(Cl)[P](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Chloro(diethyl dithiophosphato-<i>S</i>,<i>S</i>')(triphenylphosphine-<i>P</i>)palladium(II) |
Authors of publication | Panneerselvam, Kaliyamoorthy; Lu, Tian-Huey; Tung, Shu-Fang; Narayan, Sanjay; Jain, Vimal K. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1999 |
Journal volume | 55 |
Journal issue | 4 |
Pages of publication | 541 - 543 |
a | 18.178 ± 0.003 Å |
b | 9.233 ± 0.004 Å |
c | 30.904 ± 0.007 Å |
α | 90° |
β | 101.3 ± 0.01° |
γ | 90° |
Cell volume | 5086 ± 3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/a 1 |
Hall space group symbol | -P 2yab |
Residual factor for all reflections | 0.081 |
Residual factor for significantly intense reflections | 0.053 |
Weighted residual factors for all reflections | 0.217 |
Weighted residual factors for significantly intense reflections | 0.159 |
Goodness-of-fit parameter for all reflections | 1.07 |
Goodness-of-fit parameter for significantly intense reflections | 0.902 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2008342.html
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