Information card for entry 2008484
Chemical name |
2,2-di(2-methoxyphenyl)-4-methyl-7,8,9,10-tetrahydro-8,9epoxy[2H]benzo [ 1,2-b]chromene |
Formula |
C28 H26 O4 |
Calculated formula |
C28 H26 O4 |
SMILES |
O1C(C=C(c2ccc3c(c12)C[C@@H]1O[C@@H]1C3)C)(c1ccccc1OC)c1ccccc1OC.O1C(C=C(c2ccc3c(c12)C[C@H]1O[C@H]1C3)C)(c1ccccc1OC)c1ccccc1OC |
Title of publication |
2,2-Bis(2-methoxyphenyl)-4-methyl-8,9-epoxy-7,8,9,10-tetrahydro-2<i>H</i>-benzo[<i>h</i>]chromene |
Authors of publication |
Chinnakali, Kandasamy; Fun, Hoong-Kun; Sriraghavan, Kamaraj; Ramakrishnan, Vayalakkavoor T. |
Journal of publication |
Acta Crystallographica Section C |
Year of publication |
1999 |
Journal volume |
55 |
Journal issue |
5 |
Pages of publication |
768 - 770 |
a |
8.4481 ± 0.0001 Å |
b |
16.4652 ± 0.0001 Å |
c |
16.814 ± 0.0002 Å |
α |
104.33 ± 0.001° |
β |
97.886 ± 0.001° |
γ |
92.943 ± 0.001° |
Cell volume |
2235.74 ± 0.04 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
3 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.118 |
Residual factor for significantly intense reflections |
0.049 |
Weighted residual factors for all reflections included in the refinement |
0.138 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.884 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
No |
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https://www.crystallography.net/2008484.html