Information card for entry 2008838
| Chemical name |
d,l-2,4-bis(2',6'dimethylphenylthio)-3-pentanone |
| Formula |
C21 H26 O S2 |
| Calculated formula |
C21 H26 O S2 |
| SMILES |
S([C@@H](C(=O)[C@H](Sc1c(cccc1C)C)C)C)c1c(cccc1C)C.S([C@H](C(=O)[C@@H](Sc1c(cccc1C)C)C)C)c1c(cccc1C)C |
| Title of publication |
<i>dl</i>-2,4-Bis(phenylthio)pentan-3-one and <i>dl</i>-2,4-bis(2,6-dimethylphenylthio)pentan-3-one at 173K |
| Authors of publication |
Crundwell, Guy; Kessler, Jacqueline; Kaller, Matt; McCoy, Mike; Bayne, Christopher; Hardinger, Steven A.; Kantardjieff, Katherine |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1999 |
| Journal volume |
55 |
| Journal issue |
8 |
| Pages of publication |
IUC9900088 |
| a |
8.351 ± 0.0013 Å |
| b |
14.027 ± 0.002 Å |
| c |
16.201 ± 0.003 Å |
| α |
90° |
| β |
90 ± 0.003° |
| γ |
90° |
| Cell volume |
1897.8 ± 0.5 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.078 |
| Residual factor for significantly intense reflections |
0.048 |
| Weighted residual factors for all reflections included in the refinement |
0.101 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2008838.html