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Information card for entry 2009066
Preview
Coordinates | 2009066.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | 4,5-Bis[(ferrocenylmethyl)thio]-1,3-dithiole-2-thione |
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Formula | C25 H22 Fe2 S5 |
Calculated formula | C25 H22 Fe2 S5 |
SMILES | [Fe]([cH]12)([cH]13)([cH]21)([cH]12)([cH]23)([cH]12)([cH]13)([cH]21)([cH]12)[c]23CSC1SC(=S)SC=1SC[c]12[Fe]([cH]13)([cH]21)([cH]12)([cH]23)([cH]12)([cH]13)([cH]21)([cH]12)[cH]23 |
Title of publication | 4,5-Bis(ferrocenylmethylthio)-1,3-dithiole-2-thione |
Authors of publication | Low, John Nicolson; Chohan, Zahid H.; Howie, R. Alan; Wardell, James L. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1999 |
Journal volume | 55 |
Journal issue | 10 |
Pages of publication | IUC9900124 |
a | 6.0365 ± 0.0002 Å |
b | 17.3779 ± 0.0005 Å |
c | 22.679 ± 0.0008 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2379.07 ± 0.13 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 0.1 K |
Number of distinct elements | 4 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.063 |
Residual factor for significantly intense reflections | 0.044 |
Weighted residual factors for all reflections included in the refinement | 0.115 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.17 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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