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Information card for entry 2009152
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Coordinates | 2009152.cif |
---|---|
Original IUCr paper | HTML |
Common name | endo-{6,6'-Diethoxy-2,2'-[(R)-propane-1,2-diylbis(nitrilomethylidene)] diphenolato-O,N,N',O'}oxovanadium(IV) |
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Formula | C21 H24 N2 O5 V |
Calculated formula | C21 H24 N2 O5 V |
SMILES | c12c(C=[N]3[V]4([N](C[C@H]3C)=Cc3cccc(OCC)c3O4)(=O)O1)cccc2OCC |
Title of publication | <i>endo</i>-{6,6'-Diethoxy-2,2'-[(<i>R</i>)-propane-1,2-diylbis(nitrilomethylidene)]diphenolato-<i>O</i>,<i>N</i>,<i>N</i>',<i>O</i>'}oxovanadium(IV) |
Authors of publication | Hoshina, Gakuse; Tsuchimoto, Masanobu; Ohba, Shigeru |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1999 |
Journal volume | 55 |
Journal issue | 11 |
Pages of publication | 1812 - 1813 |
a | 12.783 ± 0.004 Å |
b | 16.645 ± 0.003 Å |
c | 9.834 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2092.4 ± 1 Å3 |
Cell temperature | 298 K |
Ambient diffraction temperature | 298 K |
Number of distinct elements | 5 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.067 |
Residual factor for significantly intense reflections | 0.048 |
Weighted residual factors for all reflections included in the refinement | 0.12 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.25 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2009152.html
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