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Information card for entry 2009513
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| Coordinates | 2009513.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | hexakis(2,4,6-tris(trifluoromethyl)phenyl)-cyclotristannoxane |
|---|---|
| Formula | C54 H12 F54 O3 Sn3 |
| Calculated formula | C54 H12 F54 O3 Sn3 |
| Title of publication | {Hexakis[2,4,6-tris(trifluoromethyl)phenyl]cyclotristannoxane}~2~ |
| Authors of publication | Van der Maelen Uría, Juan F.; Belay, Maekele; Edelmann, Frank T.; Sheldrick, George M. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1994 |
| Journal volume | 50 |
| Journal issue | 3 |
| Pages of publication | 403 - 407 |
| a | 24.842 ± 0.005 Å |
| b | 22.471 ± 0.004 Å |
| c | 24.656 ± 0.005 Å |
| α | 90° |
| β | 111.16 ± 0.03° |
| γ | 90° |
| Cell volume | 12836 ± 5 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0594 |
| Residual factor for significantly intense reflections | 0.0456 |
| Weighted residual factors for all reflections | 0.1227 |
| Weighted residual factors for significantly intense reflections | 0.1141 |
| Goodness-of-fit parameter for all reflections | 1.035 |
| Goodness-of-fit parameter for significantly intense reflections | 1.074 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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